CREDENCE SYSTEMS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 53107
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 15432
 
  
 
H03K PULSE TECHNIQUE 10121
 
  
 
G11C STATIC STORES 4147
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 476
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 3195
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 3282
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 298
 
  
 
H03B GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS 261
 
  
 
H03H IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS 269

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8649993 Multi-domain execution of tests on electronic devicesSep 12, 06Feb 11, 14[G01R]
8504867 High resolution clock signal generatorSep 28, 10Aug 06, 13[G06F]
8295182 Routed event test system and methodJul 02, 08Oct 23, 12[H04L]
7805628 High resolution clock signal generatorApr 02, 01Sep 28, 10[G06F]
7765443 Test systems and methods for integrated circuit devicesMay 07, 04Jul 27, 10[G01R]
7615990 Loadboard enhancements for automated test equipmentJun 28, 07Nov 10, 09[G01R]
7496467 Automatic test equipment operating architectureJun 05, 06Feb 24, 09[G06F]
7454678 Scan stream sequencing for testing integrated circuitsAug 23, 05Nov 18, 08[G01R]
7439728 System and method for test socket calibration using composite waveformJul 19, 05Oct 21, 08[G01R]
7430130 D-optimized switching converterMay 18, 06Sep 30, 08[H02M]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7810005 Method and system for correcting timing errors in high data rate automated test equipmentExpiredOct 31, 07Oct 05, 10[G06F]
7761751 Test and diagnosis of semiconductorsExpiredFeb 20, 07Jul 20, 10[G06F, G01R]
2010/0023,294 AUTOMATED TEST SYSTEM AND METHODAbandonedAug 28, 08Jan 28, 10[G01R]
7627790 Apparatus for jitter testing an ICExpiredNov 18, 04Dec 01, 09[H03L, H04L, H04Q, H04B, G06F, G04F, G01R, H03H, G04G, G06K]
7532014 LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testersExpiredAug 08, 06May 12, 09[G01P, G01R]
7492181 Method and device for enabling the measurement of device under test voltages using a testing instrument of limited rangeExpiredMay 31, 06Feb 17, 09[G01R]
2009/0007,033 Method to transfer failure analysis-specific data between data between design houses and fab's/FA labsAbandonedJun 28, 07Jan 01, 09[G06F]
7471100 Semiconductor integrated circuit tester with interchangeable tester moduleExpiredNov 05, 07Dec 30, 08[G01R]
7471753 Serializer clock synthesizerExpiredFeb 01, 05Dec 30, 08[H04L]
2008/0238,461 Multi-type test interface system and methodAbandonedJul 10, 07Oct 02, 08[G01R]
7414438 Clock based voltage deviation detectorExpiredMar 17, 04Aug 19, 08[H03K]
7409617 System for measuring characteristics of a digital signalExpiredSep 30, 04Aug 05, 08[G01R]
7389449 Edge selecting triggering circuitExpiredFeb 28, 05Jun 17, 08[G11B]
7370255 Circuit testing with ring-connected test instrument modulesExpiredFeb 01, 05May 06, 08[G01R]
2008/0062,603 Apparatus and method for overload protection of electronic circuitryAbandonedSep 12, 06Mar 13, 08[H02H]
7336066 Reduced pin count test method and apparatusExpiredMay 21, 04Feb 26, 08[G01R]
2007/0294,580 VIRTUAL TESTER ARCHITECTUREAbandonedMay 31, 06Dec 20, 07[G06F]
7292059 Power supply assembly for a semiconductor circuit testerExpiredMar 31, 05Nov 06, 07[G01R]
2007/0220,380 Message system for logical synchronization of multiple tester chipsAbandonedMar 20, 06Sep 20, 07[G01R]
7271664 Phase locked loop circuitExpiredOct 18, 05Sep 18, 07[H03L]

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